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scanning electron micrograph中文是什么意思

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用"scanning electron micrograph"造句"scanning electron micrograph"怎么读"scanning electron micrograph" in a sentence

中文翻译手机手机版

  • 【物理学】扫描电子显微照相。

例句与用法

  • Scanning electron micrograph
    扫描电子放大器
  • This colorized scanning electron micrograph shows pollens ? bermuda grass in green , maple in red , and rag weed in yellow ? at roughly 3 , 000 times their itchy , sneezy life size
    这是彩色扫描电子显微图，上面显示的是各种花粉，绿色的是百慕大草，红色的是枫木，黄色的是杂草。大概放大到了它们自身的3000倍，跟人的喷嚏一样大！
  • Based on analyzing data from thin section , scanning electron micrograph and mercury injection , using nuclear magnetic resonance ( nmr ) , rock - electr experiment and numerical simulation techniquess , etc . to analyze main origin of complex oil and water zones
    摘要在对薄片、扫描电镜、压汞资料分析基础上，采用核磁共振、岩电实验和数值模拟等手段，分析研究了复杂油水层的主要成因。
  • By analyzing the microstructure of as - cast alloys with different surplus of samarium added , the optimum surplus of samarium is decided . by comparing the microstructure of the alloys annealed for different time , the ideal and economical annealing time is confirmed . the microstructure and phase composition of alloys during the whole preparation of sm2fe17nx are analyzed using the scanning electron micrograph with energy - dispersive x - ray analysis and x - ray diffraction patterns
    本论文首先就熔炼工艺参数对铸态组织微结构的影响进行了探讨，并制定出一套较为合适的熔炼工艺；通过对不同钐加入量的铸态组织微观结构的观察分析，确定了原料配置过程中钐的最佳补偿量；通过对采用不同退火时间的合金组织进行比较，确定了理想、经济的退火时间；同时还利用扫描电子显微图像和x射线衍射图谱，比较了整个制备过程中，试样微结构和相组成的变化情况。
  • The chemical composition and microstructures of the insulating thin films prepared by different methods were analyzed by x - ray diffraction ( xrd ) and scanning electron micrograph ( sem ) ; other properties such as electric resistance , the breakdown field strength and dielectric properties were evaluated using high resistance meter , voltage resistance meter and precision impedance analyzer respectively
    采用x射线衍射仪( xrd )对表面绝缘薄膜的物相组成进行了分析,扫描电子显微镜( sem )对表面绝缘薄膜的微观结构进行了研究,并用绝缘电阻测试仪、耐压测试仪和精密阻抗分析仪分别对绝缘膜进行绝缘电阻率、击穿场强和介电性能的测试。
  • The dependence of oxygen precipitation and induced - defects in heavily as - doped silicon on heat treatment process was studied by annealing and ig process , chemical etching , scanning electron micrograph ( sem ) and transmission electron microscopy ( tem ) . a developed ig technique was suggested and the mechanism of the influence of as on oxygen precipitation formation in heavily as - doped silicon was discussed
    本文通过化学腐蚀、光学显微镜、扫描电镜( sem ) 、透射电境( tem )等分析技术，对重掺砷硅单晶在单步退火工艺和内吸杂退火工艺中氧沉淀及诱生缺陷的形态，形核与热处理温度、时间的关系等进行了研究。
  • The fabrication parameters were preliminarily optimized . the morphology and composition of the samples of the diamond film for different b / c ratios was investigated by scanning electron micrograph ( sem ) and raman scattering spectroscopy ( raman ) . the content of different levels of b dopant in the diamond film was tested by secondary ion mass spectrometry ( sims )
    阐述了掺硼金刚石膜的制备工艺，研究了掺硼金刚石膜成核和生长的影响因素，初步优化了沉积掺硼金刚石膜工艺参数，同时对掺硼金刚石膜进行了扫描分析、拉曼分析、二次离子质谱分析和电阻率测试。
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